Analysis (granulometry) from sample 75509
Methodgranulometry
Person/InstitutionKleesment
Sample number
Remarksgran. frakts., savi
Locality
Depth18.4
Depth to18.5
Stratigraphy
InstitutionDepartment of Geology, TalTech
Date added2006-03-13
Date changed2006-03-13
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